SEM Imaging of Polycrystalline Samples of Cr Intercalated TaTe2

A grayscale scanning electron microscope (SEM) image of a layered, crystalline structure. The object consists of several thin, flat, jagged plates stacked unevenly on top of each other against a dark, textured background. The plates on the left have rounded, puzzle-piece edges, while the sections on the right appear more angular and sharp, with fine dust-like particles scattered across the surfaces

Artist

David Saakov

Description

This image was created using the JOEL Scanning Electron Microscope in the Chemical Sciences Laboratory using 25kV accelerating voltage for higher resolution. The SEM is a high-powered microscope using electron beams to capture images of extremely small samples, in this case, a polycrystalline sample of Cr intercalated TaTe2. Furthermore, the SEM on campus is also attached with an EDS which can elementally map and point ID a sample to show the composition of the elements and confirm the elements present in a sample.

Here you can see how these crystals grow in thin sheets, which is very common in these types of 2-D materials. These materials are very commonly used in many wide applications involving energy storage, electronics and optoelectronics, quantum computing, sensors, magnetic materials, etc.

Type

Scanning Electron Microscope

Artist Affiliation

Graduate Student

Department

Department of Chemistry and Biochemistry

Area of Research

Solid State Chemistry and Magnetism

Research Group Site

Shatruck Research Group

Date

2025